• Chinese Science Citation Database(CSCD)
  • Chinese Scientific and Technological Paper and Citation Database (CSTPCD)
  • China National Knowledge Infrastructure(CNKI)
  • Chinese Science Abstracts Database(CSAD)
  • JST China
  • SCOPUS

Latest Notice

Latest Notice

WeChat Official Account

WeChat Official Account

ZHOU Changlin, LIANG Zhenhe, YU Daojie, ZHAO Shouguo, QIAN Zhisheng. Temperature effects on electromagnetic susceptibility of digital signal controller[J]. CHINESE JOURNAL OF RADIO SCIENCE, 2016, 31(6): 1053-1059. doi: 10.13443/j.cjors.2016082401
Reference format: ZHOU Changlin, LIANG Zhenhe, YU Daojie, ZHAO Shouguo, QIAN Zhisheng. Temperature effects on electromagnetic susceptibility of digital signal controller[J]. CHINESE JOURNAL OF RADIO SCIENCE, 2016, 31(6): 1053-1059. doi: 10.13443/j.cjors.2016082401

Temperature effects on electromagnetic susceptibility of digital signal controller

More Information
  • Received Date: August 23, 2016
  • Available Online: December 30, 2020
  • Published Date: December 30, 2016
  • Due to the electromagnetic compatibility problems of a typical digital signal controller (DSC), a method that analyzes the electromagnetic characteristics and temperature characteristics simultaneously is presented. The ambient temperature effect on electromagnetic susceptibility is studied. Based on the structure of behavior electromagnetic susceptibility model, the mechanism of electromagnetic interference is analyzed, and the influence which ambient temperature exerts on the mobility and threshold voltage of metal-oxide-semiconductor (MOS) transistors in DSC is derived. Combining the method of direct power injection and temperature control, the varieties of characteristic parameters of each part in susceptibility model at different temperatures is measured and simulated, revealing the internal factors of the susceptibility changes. Then, the threshold of DSC electromagnetic susceptibility is measured. Results show that the mobility and threshold voltage of MOS transistors in DSC immunity behavior is changed with ambient temperatures, which leads to the drift of DSC electromagnetic susceptibility.
  • [1]
    刘尚合, 刘卫东.电磁兼容与电磁防护相关研究进展[J].高电压技术, 2014, 40(12): 1605-1613. http://d.old.wanfangdata.com.cn/Periodical/gdyjs201406001

    LIU S H, LIU W D. Progress of relevant research on eletromagnetic compatibility and electromagnetic protection[J]. High voltage engineering, 2014, 40(12): 1605-1613.(in Chinese) http://d.old.wanfangdata.com.cn/Periodical/gdyjs201406001
    [2]
    阳彪, 吕英华, 徐军, 等.飞行器内的传输线与连接器电路串扰分析[J].电波科学学报, 2009, 24(3): 505-509. doi: 10.3969/j.issn.1005-0388.2009.03.024

    YANG B, LV Y H, XU J, et al. Crosstalk of typical circuits composed of transmission lines and connectors in aircraft[J]. Chinese journal of radio science, 2009, 24(3): 505-509. (in Chinese) doi: 10.3969/j.issn.1005-0388.2009.03.024
    [3]
    GROS J B, DUCHAMP G, LEVANT J L, et al. Control of the electromagnetic compatibility: an issue for IC reliability[J]. Microelectronics reliability, 2011, 51(9/11): 1493-1497. http://www.sciencedirect.com/science/article/pii/S0026271411003180
    [4]
    XIONG C, LIU S, LI Y, et al. Hot carrier effect on the bipolar transistors' response to electromagnetic interference[J]. Microelectronics reliability, 2014, 55(3/4): 514-519. http://www.wanfangdata.com.cn/details/detail.do?_type=perio&id=ac3b1f173f97d127956f586849f7a696
    [5]
    RAMDANI M, SICARD E, BOYER A, et al., The electromagnetic compatibility of integrated circuits—emdash Past, present, and future[J]. IEEE transactions on electromagnetic compatibility, 2009, 51(1): 78-100. doi: 10.1109/TEMC.2008.2008907
    [6]
    潘晓东, 魏光辉, 卢新福, 等.注入法等效替代电磁辐照法试验技术研究[J].电波科学学报, 2013, 28(1): 97-104. http://www.cjors.cn/CN/abstract/abstract597.shtml

    PAN X D, WEI G H, LU X F, et al. Testing technology of using injection as a substitute for electromagnetic radiation[J]. Chinese journal of radio science, 2013, 28(1): 97-104. (in Chinese) http://www.cjors.cn/CN/abstract/abstract597.shtml
    [7]
    BEN DHIA S, BOYER A. Long-term electro-magnetic robustness of integrated circuits: EMRIC research project[J]. Microelectronics reliability, 2013, 53(9/11): 1266-1272. http://www.sciencedirect.com/science/article/pii/S0026271413003272
    [8]
    WU J F, BOYER A, LI J C, et al. Characterization of changes in LDO susceptibility after electrical stress[J]. IEEE transactions on electromagnetic compatibility, 2013, 55(5): 883-890. doi: 10.1109/TEMC.2013.2242471
    [9]
    BEN DHIA S, BOYER A, LI B, et al. Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests[J]. Electronics Letters, 2010, 46(4):278-280. doi: 10.1049/el.2010.2885
    [10]
    LIANG Z, ZHOU C, ZHAO S, et al. Analysis of temperature effect on electromagnetic susceptibility of microcontroller[C]//7th Asia-Pacific Conference on Environmental Electromagnetics. Hangzhou, 2015: 254-257.
    [11]
    粟涛, 杨叶花, 王自鑫, 等.微控制器射频抗扰性与受测引脚类型的关系[J].电波科学学报, 2013, 28(4): 735-743. http://www.cjors.cn/CN/abstract/abstract862.shtml

    SU T, YANG Y H, WANG Z X, et al. Relationship between radio frequency immunity and type of the pin under test of microcontrollers[J]. Chinese journal of radio science, 2013, 28(4): 735-743.(in Chinese) http://www.cjors.cn/CN/abstract/abstract862.shtml
    [12]
    GAO X L, TIAN C Y, LAO L Y, et al. Improved direct power injection model of 16-bit microcontroller for electromagnetic immunity prediction[J]. Journal of Central South University of Technology, 2011, 18(6): 2031-2035. doi: 10.1007/s11771-011-0938-5
    [13]
    ALAELDINE A, PERDRIAU R, RAMDANI M, et al. A direct power injection model for immunity prediction in integrated circuits[J]. IEEE transactions on electromagnetic compatibility, 2008, 50: 52-62. doi: 10.1109/TEMC.2007.911920
    [14]
    BOYER A, FER M, COURAU L, et al. Modelling of the susceptibility of 90 nm Input Output Buffer[C]//IEEE Asia-Pacific Symposium on Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008: 32-35.
    [15]
    刘恩科.半导体物理学[M]. 7版.北京:电子工业出版社, 2011: 106-123.

    LIU E K. Semiconductor physics[M]. 7th ed. Beijing: Publishing House of Electronics Industry, 2011: 106-123.(in Chinese)
    [16]
    IEC. IEC 62132-4 Integrated circuits—measurement of electromagnetic immunity 150 kHz to 1 GHz-Part 4: direct RF power injection method[S]. International Electrotechnical Commission, 2006.
    [17]
    刘统, 周长林, 周东方, 等. 32位数字信号控制器敏感度分析[J].强激光与粒子束, 2015, 27(10): 44-48. http://d.old.wanfangdata.com.cn/Periodical/qjgylzs201510010

    LIU T, ZHOU C L, ZHOU D F, et al. Electromagnetic susceptibility analysis of 32 bit digital signal controller[J]. High power laser & particle beams, 2015, 27(10): 44-48.(in Chinese) http://d.old.wanfangdata.com.cn/Periodical/qjgylzs201510010
    [18]
    LIU T, ZHOU C, WANG Z, et al. Characterisation of system clock frequency effects on electromagnetic immunity of microcontroller input buffer[J]. Electronics letters, 2015, 51(23):1861-1863. doi: 10.1049/el.2015.1823
  • Related Articles

    [1]TIAN Yanmin, LIU Yingjun, LIU Min. A method for improving the influence of detector temperature characteristics on the measurement accuracy of HPM power[J]. CHINESE JOURNAL OF RADIO SCIENCE. DOI: 10.12265/j.cjors.2024141
    [2]XIA Yu, LIU Dongping, YANG Liu, CHEN Jingfeng, LIANG Xianling, JIN Ronghong. Power control method based on 1 bit time modulation technique[J]. CHINESE JOURNAL OF RADIO SCIENCE, 2022, 37(6): 948-955, 961. DOI: 10.12265/j.cjors.2022098
    [3]SHENG Lili, CAO Weiping, MEI Lirong, ZHANG Shunlan, LIN Yixiang, LU Lucong. A low profile beam controlling antenna based on digital metasurface[J]. CHINESE JOURNAL OF RADIO SCIENCE, 2021, 36(6): 938-946. DOI: 10.12265/j.cjors.2021123
    [4]WU Xujing, WANG Mengjun, WU Jianfei, LI Binhong, HAO Ning, GAO Jiantou, LI Hong, ZHANG Hongli. Temperature effect on electromagnetic sensitivity of SRAM chips in bulk Si and SOI technologies[J]. CHINESE JOURNAL OF RADIO SCIENCE, 2021, 36(1): 101-108. DOI: 10.13443/j.cjors.2019081901
    [5]WANG Hao, LI Junfeng, LIU Junjie, WU Shan, LIU Lei, CAO Zhanhong. Circuit of automatic gain control for airborne transient electromagnetic receiving signal[J]. CHINESE JOURNAL OF RADIO SCIENCE, 2019, 34(4): 524-530. DOI: 10.13443/j.cjors.2018120301
    [6]LIU Gaohui, ZHANG Juanjuan. Fractional lower order cyclic spectrum analysis of digital frequency shift keying signals under the alpha stable distribution noise[J]. CHINESE JOURNAL OF RADIO SCIENCE, 2017, 32(1): 65-72. DOI: 10.13443/j.cjors.2017011001
    [7]LÜ Yinghua, GAN Xi, ZHANG Jinling, ZHENG Zhanqi, WAN Wengang, WEN Shuhua. Gysel power divider with fixed amplitude and phase-only beam control[J]. CHINESE JOURNAL OF RADIO SCIENCE, 2016, 31(2): 358-362. DOI: 10.13443/j.cjors.2015061004
    [8]CAO Haiqing, WANG Yu, DU Mingfang, FANG Jianjun. Active disturbance rejection controller for small-sized float antenna[J]. CHINESE JOURNAL OF RADIO SCIENCE, 2014, 29(5): 841-847. DOI: 10.13443/j.cjors.2013101002
    [9]LI Li, LIU Jing, ZHOU Xiaoping, LING Hongtao. Dynamic spectrum access screening algorithm based on transmit power control[J]. CHINESE JOURNAL OF RADIO SCIENCE, 2013, 28(5): 837-842.
    [10]SUN Gangcan, WANG Zhongyong, LIU Zhengwei. Performance analysis of modulation recognition of MPSK signals based on high-order cumulants[J]. CHINESE JOURNAL OF RADIO SCIENCE, 2012, 27(4): 825-831,839.
  • Cited by

    Periodical cited type(4)

    1. 吴旭景,王蒙军,吴建飞,李彬鸿,郝宁,高见头,李宏,张红丽. 体Si和SOI工艺SRAM芯片电磁敏感度的温度效应. 电波科学学报. 2021(01): 101-108 . 本站查看
    2. 赵鹏,赵明敏,刘冠辰,郑志超,杨志超,陈恒林. 极端温度条件下电子式电流互感器采集卡电磁抗扰度性能的实验研究. 电网技术. 2020(02): 718-724 .
    3. 李向前,王蒙军,吴建飞,李尔平,李彬鸿,郝宁,高见头. 传导电磁干扰对绝缘衬底上硅工艺器件的影响研究. 固体电子学研究与进展. 2020(02): 149-153 .
    4. 程俊平,徐志坚,周长林,张栋耀. 数字逻辑电路GPIO电磁抗扰度的热应力效应分析. 电波科学学报. 2019(04): 447-454 . 本站查看

    Other cited types(5)

Catalog

    Article views (217) PDF downloads (156) Cited by(9)
    Related

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return