Abstract: A method based on integral equation equivalent circuit(IEEC) and Baum-Liu-Tesche(BLT) equation is proposed to analyze conducted coupling effects of the electromagnetic pulse. The method is adopted to get the equivalent source model, corresponding current and resistance parameters of external electromagnetic interference. Furthermore, electromagnetic pulse effects of the electronic equipment with complex transmission line network and integrated circuit are computed by the electromagnetic topology theory and BLT equation. Finally, the influence of transmission line topology, the signal line length, radius and the node load resistance on conducted coupling effects is analyzed. Experimental results are consistent with simulation results of CST software, which proves the validity of the presented method. The research and simulation results can provide reference to the electromagnetic protection design of the electronic equipment.