Ray tracing method for electromagnetic scattering computation fromcomplex target with curved surface dielectric structure

A ray tracing method combining the curvature reconstruction of faceted model with the ray-density normalization (RDN) is presented for electromagnetic(EM) scattering computation from electrically large complex target with curved surface dielectric structure. This method calculates the principal radii of curvature by curvature reconstruction, considers the different divergence or convergence effect for convex or concave surface illuminated by EM waves from optically thin medium to optically dense medium and from optically dense medium to optically thin medium, and calculates the contribution of each ray to the total scattered field by using RDN. The method also overcomes the singularity of traditional ray tubes at caustics by introducing the power tracing when the impact point between the ray and the interface is located at caustics. Simulation results verify the accuracy and efficiency of the proposed method.